2019,
Jimenez H, Wang M, Zimmerman JW, Pennison MJ, Sharma S, Surratt T, Xu ZX, Brezovich I, Absher D, Myers RM, DeYoung B, Caudell DL, Chen D, Lo HW, Lin HK, Godwin DW, Olivier M, Ghanekar A, Chen K, Miller LD, Gong Y, Capstick M, D'Agostino Jr RB, Munden R, Merle P, Barbault A, Blackstock AW, Bonkovsky HL, Yang GY, Jin G, Liu L, Zhang W, Watabe K, Blackman CF, Pasche BC
2019,
Sharma S, Wu SY, Jimenez H, Xing F, Zhu D, Liu Y, Wu K, Tyagi A, Zhao D, Lo HW, Metheny-Barlow L, Sun P, Bourland JD, Chan MD, Thomas A, Barbault A, D'Agostino RB, Whitlow CT, Kirchner V, Blackman C, Pasche B, Watabe K
2019,
Danciu M, Alexa-Stratulat T, Stefanescu C, Dodi G, Tamba BI, Mihai CT, Stanciu GD, Luca A, Spiridon IA, Ungureanu LB, Ianole V, Ciortescu I, Mihai C, Stefanescu G, Chirilă I, Ciobanu R, Drug VL
2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), Saint Petersburg and Moscow, Russia. IEEE: 1295-1297; ISBN 978-1-7281-0340-2
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