16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 141-144; ISBN 978-1-5090-3198-6
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Schmiedel A, Hackenbroch M, Yang A, Nahle CP, Skowasch D, Meyer C, Schimpf R, Schild H, Sommer T