Zin TT, Lin JCW (eds.): Big Data Analysis and Deep Learning Applications. ICBDL 2018. Advances in Intelligent Systems and Computing, volume 744; Springer, Singapore; pp. 191-198; ISBN 978-981-13-0868-0
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: pp. 78-81; ISBN 978-1-7281-1639-6
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