2016,
Voloshin T, Munster M, Blatt R, Shteingauz A, Roberts PC, Schmelz EM, Giladi M, Schneiderman RS, Zeevi E, Porat Y, Bomzon Z, Urman N, Itzhaki A, Cahal S, Kirson ED, Weinberg U, Palti Y
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM), Erlagol. IEEE: pp. 657-660; ISBN 978-1-5090-0787-5