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2018,
Marrella A, Iafisco M, Adamiano A, Rossi S, Aiello M, Barandalla-Sobrados M, Carullo P, Miragoli M, Tampieri A, Scaglione S, Catalucci D
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Ansal KA, Jose DS, Rajan RK
2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET), Kottayam, India. IEEE: pp. 1-5; ISBN 978-1-5386-0577-6
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2018,
Venkateswaran N, Galor A
JAMA Ophthalmol 136 (1): e175719
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2018 IEEE Symposium on Product Compliance Engineering (ISPCE), San Jose, CA, USA. IEEE: pp. 1-6; ISBN 978-1-5386-3433-2
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2018 Advances in Science and Engineering Technology International Conferences (ASET), Dubai, Sharjah, Abu Dhabi, United Arab Emirates. IEEE: pp. 1-5; ISBN 978-1-5386-2400-5
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Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: pp. 28-31; ISBN 978-1-5090-3955-5
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Kamimura Y, Inagaki S, Wake K
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: pp. 855-859; ISBN 978-1-4673-9699-8
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Piper S, Ball L, Mandziuk M
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: pp. 448-453; ISBN 978-1-5386-6622-7
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Haridim M, Hilly O, Levi L, Lesnik R, Milgrom B
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Reykjavik, Iceland. IEEE: pp. 1-3; ISBN 978-1-5386-5205-3
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Korzeniewska E, Krawczyk A, Lada-Tondyra E
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: pp. 125-128; ISBN 978-1-5386-6937-2
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2018,
Belrhiti L, Riouch F, Tribak A, Terhzaz J, Bouyahyaoui A, Sanchez AM
2018 6th International Conference on Multimedia Computing and Systems (ICMCS), Rabat, Morocco. IEEE: pp. 1-6; ISBN 978-1-5386-6221-2
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Taguchi K, Laakso I, Aga K, Hirata A, Diao Y, Chakarothai J, Kashiwa T
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2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 1004-1009; ISBN 978-1-5386-5063-9
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