The following terms were included:
Gleichstrom, DC, "direct current", 直流
-
Federal Office for Radiation Protection (BfS),
1-90
-
2018,
Khalifeh JM, Zohny Z, MacEwan M, Stephen M, Johnston W, Gamble P, Zeng Y, Yan Y, Ray WZ
IEEE Rev Biomed Eng 11: 217-232
-
2018,
Chen L, Milligan B, Qu T, Jeevananthan L, Shaker G, Safavi-Naeini S
IEEE Antennas Propag Mag 60 (5): 108-124
-
2018,
Chen X, Liu HC, Gong HT, Wang HH, Zhang JH
2018 International Conference on Power System Technology (POWERCON), Guangzhou, China. IEEE: 1-5; ISBN 978-1-5386-6462-9
-
2018,
Calabrò E, Magazù S
Phys Lett A 382 (21): 1389-1394
-
2018,
Kono M, Takahashi T, Nakamura H, Miyaki T, Rekimoto J
ACM Trans Comput Hum Interact 25 (3): 19
-
BGBl I (41): 2187-2196
-
2018,
Kornarzynski K, Muszynski S
J Elem 23 (3): 1021-1031
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN VDE 0100-410 VDE 0100-410:2018-10
-
2018,
Liu A, Vöröslakos M, Kronberg G, Henin S, Krause MR, Huang Y, Opitz A, Mehta A, Pack CC, Krekelberg B, Berényi A, Parra LC, Melloni L, Devinsky O, Buzsáki G
Nat Commun 9: 5092
-
2018,
Hutchison ZL, Sigray P, He H, Gill AB, King J, Gibson C
Bureau of Ocean Energy Management (U.S. Department of the Interior) (BOEM),
OCS Study BOEM 2018-003: 1-254
-
2018,
Almousa A, Alajaji R, Alaboudi M, Al-Sultan F, Bashir S
Behav Sci 8 (9): E81
-
2018,
O'Connell NE, Marston L, Spencer S, Desouza LH, Wand BM
Cochrane Database Syst Rev 3: CD008208
-
2018,
Cieslar G, Sowa P, Sieron K, Sieron A
2018 Baltic URSI Symposium (URSI), Poznan, Poland. IEEE: 5-6; ISBN 978-1-5386-1360-3
-
International Electrotechnical Commission (IEC),
IEC 60479-1:2018: 1-72, ISBN 978-2-8-3226295-5
-
2018,
Lattari E, Oliveira BRR, Monteiro Júnior RS, Marques Neto SR, Oliveira AJ, Maranhão Neto GA, Machado S, Budde H
PLoS One 13 (12): e0209513
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN IEC 60974-1:2018-12 VDE 0544-1:2018-12
-
2018,
Rufener KS, Geyer U, Janitzky K, Heinze HJ, Zaehle T
Eur J Neurosci 48 (6): 2301-2309
-
2018,
Chen PL, Stenling A, Machado L
Vision 2 (4): E42
-
2018,
Imaninezhad M, Pemberton K, Xu F, Kalinowski K, Bera R, Zustiak SP
J Neural Eng 15 (5): 056034
-
2018,
Arendsen LJ, Hugh-Jones S, Lloyd DM
J Pain 19 (7): 807-818
-
2018,
Fusco G, Scandola M, Feurra M, Pavone EF, Rossi S, Aglioti SM
Eur J Neurosci 48 (10): 3159-3170
-
2018,
Giboin LS, Gruber M
J Neurosci Res 96 (9): 1600-1609
-
2018,
Ward BK, Lee YH, Roberts DC, Naylor E, Migliaccio AA, Della Santina CC
Otol Neurotol 39 (10): e1150-e1159
-
2018,
Carvalho S, Leite J, Pinto CB, Morse LR, Zafonte R, Fregni F
J Spinal Cord Med 41 (5): 547-548
-
2018,
Lee EHM, Chan PY, Law EYL, Lin JJX, Hui CLM, Chang WC, Chan SKW, Chen EYH
Schizophr Res 202: 423-425
-
2018,
Koo PC, Mölle M, Marshall L
Eur J Neurosci 47 (7): 812-823
-
2018,
Foerster Á, Dutta A, Kuo MF, Paulus W, Nitsche MA
Eur J Neurosci 47 (7): 779-789
-
2018,
Axelrod V, Zhu X, Qiu J
Sci Rep 8: 15975
-
2018,
Choy O, Raine A, Hamilton RH
J Neurosci 38 (29): 6505-6512
-
2018,
Lee SB, Kim HT, Yang HO, Jang W
Sci Rep 8: 15165
-
2018,
Huang Y, Thomas C, Datta A, Parra LC
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3545-3548; ISBN 978-1-5386-3647-3
-
2018,
Wang X, Wong WW, Fang Y, Chu WC, Wong KS, Tong RK
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 1037-1040; ISBN 978-1-5386-3647-3
-
2018,
Cui H, Wei J, Ke Y, An X, Sun C, Xu M, Qi H, Ming D, Zhou P
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3481-3484; ISBN 978-1-5386-3647-3
-
2018,
Thomas C, Datta A, Woods A
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3084-3087; ISBN 978-1-5386-3647-3
-
2018,
Gijssels T, Ivry RB, Casasanto D
Sci Rep 8: 11452
-
2018,
Niu T, Bennett CJ, Keller TL, Leiter JC, Lu DC
Sci Rep 8: 12549
-
2018,
Latchoumane CV, Jackson L, Sendi MSE, Tehrani KF, Mortensen LJ, Stice SL, Ghovanloo M, Karumbaiah L
Sci Rep 8: 10957
-
2018,
Wunder S, Hunold A, Fiedler P, Schlegelmilch F, Schellhorn K, Haueisen J
Sci Rep 8: 7259
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.90 (07/2018): 1-28
-
2018,
Tse NY, Goldsworthy MR, Ridding MC, Coxon JP, Fitzgerald PB, Fornito A, Rogasch NC
Sci Rep 8: 8526
-
2018,
Mioni G, Grondin S, Mapelli D, Stablum F
Sci Rep 8: 10364
-
2018,
Ketz N, Jones AP, Bryant NB, Clark VP, Pilly PK
J Neurosci 38 (33): 7314-7326
-
2018 IEEE IAS Electrical Safety Workshop (ESW), Fort Worth, TX, USA. IEEE: 1-8; ISBN 978-1-5386-1560-7
-
2018,
Ramaraju S, Roula MA, McCarthy PW
J Neural Eng 15 (1): 016019
-
2018,
Taphoorn MJB, Dirven L, Kanner AA, Lavy-Shahaf G, Weinberg U, Taillibert S, Toms SA, Honnorat J, Chen TC, Sroubek J, David C, Idbaih A, Easaw JC, Kim CY, Bruna J, Hottinger AF, Kew Y, Roth P, Desai R, Villano JL, Kirson ED, Ram Z, Stupp R
JAMA Oncol 4 (4): 495-504
-
2018 IEEE Symposium on Product Compliance Engineering (ISPCE), San Jose, CA, USA. IEEE: 1-6; ISBN 978-1-5386-3433-2
-
2018,
McDermott B, Porter E, Hughes D, McGinley B, Lang M, O'Halloran M, Jones M
J Alzheimers Dis 65 (2): 363-392
-
2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 28-31; ISBN 978-1-5090-3955-5
-
2018,
Higuera-Hernández MF, Reyes-Cuapio E, Gutiérrez-Mendoza M, Rocha NB, Veras AB, Budde H, Jesse J, Zaldívar-Rae J, Blanco-Centurión C, Machado S, Murillo-Rodríguez E
Clin Nutr ESPEN 25: 50-55