High Noon for Mobile Networks: Short-Time EMF Measurements to Capture Daily Exposure tech./dosim.

By: Adda S, Chiaraviglio L, Franci D, Lodovisi C, Pasquino N, Pavoncello S, Pedroli C, Pelosini R
Published in: IEEE Trans Instrum Meas 2023; 72: 5504410
Download citation in RIS format

Exposure