Modeling and Measurement of Exposure to Realistic Non-Uniform Electric Fields at 50 Hz tech./dosim.

Published in: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE, 2019: pp. 334-337; ISBN 978-1-7281-1639-6