atomic force microscopy

Synonyms:
  • scanning force microscopy
German: Rasterkraftmikroskopie
Japanese: 原子間力顕微鏡

Physics. A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. It is a useful tool for imaging and measuring matter producing a topographic map of the sample at nanometer scale.

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