2017,
Sheng Y, Beguin E, Nesbitt H, Kamila S, Owen J, Barnsley LC, Callan B, O'Kane C, Nomikou N, Hamoudi R, Taylor MA, Love M, Kelly P, O'Rourke D, Stride E, McHale AP, Callan JF
2017,
Green AC, Coggon D, de Sèze R, Gowland PA, Marino C, Peralta AP, Söderberg PG, Stam R, Ziskin MC, van Rongen E, Feychting M, Asmuss M, Croft R, D'Inzeo G, Hirata A, Miller S, Oftedal G, Okuno T, Röösli M, Sienkiewicz Z, Watanabe S
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE), Novosibirsk, Russia. IEEE: pp. 402-408
2016,
Espin-Lopez PF, Martellosio A, Pasian M, Bozzi M, Perregrini L, Mazzanti A, Svelto F, Bellomi M, Renne G, Summers PE