16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 97-102; ISBN 978-1-5090-3198-6
2005,
Nyenhuis JA, Amjad A, Kamondetdacha R, Park SM
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 13-16; ISBN 978-1-5090-3198-6
This website uses cookies to provide you the best browsing experience. By continuing to use this website you accept our use of cookies.