The following terms were included:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2018 IEEE Symposium on Product Compliance Engineering (ISPCE), San Jose, CA, USA. IEEE: 1-6; ISBN 978-1-5386-3433-2
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Kosta P, Paknahad J, Rodríguez ESG, Loizos K, Roy A, Talbot N, Seidman S, Datta P, Dai R, Pollack B, Greenberg R, Lazzi G
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2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 959-962; ISBN 978-1-5090-3955-5
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2018,
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2018 Down to Earth Conference (DTEC), Melbourne, VIC, Australia. IEEE: 1-6; ISBN 978-1-7281-0327-3
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2018,
Swanson 2nd RL, Hampton S, Green-McKenzie J, Diaz-Arrastia R, Grady MS, Verma R, Biester R, Duda D, Wolf RL, Smith DH
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International Electrotechnical Commission (IEC),
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2018 International Conference on Radar, Antenna, Microwave, Electronics, and Telecommunications (ICRAMET), Serpong, Indonesia. IEEE: 66-69; ISBN 978-1-5386-6520-6
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2018,
Adams C, Scott W, Basile J, Hughes L, Leigh J, Schiller A, Walton J
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National Toxicology Program (NTP),
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2018,
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2018 International Conference on Power Energy, Environment and Intelligent Control (PEEIC), Greater Noida, India. IEEE: 311-314; ISBN 978-1-5386-2342-8
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2018,
Mohamed AAS, Meintz A, Schrafel P, Calabro A
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2018,
Dowdle LT, Brown TR, George MS, Hanlon CA
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