15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 171-174; ISBN 978-1-5090-3197-9
2003,
Dobson J, Cranfield CG, Al Maddan J, Wieser HG
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 293-296; ISBN 978-1-5090-3197-9