The following terms were included:
t-検定, t-Test, "Student's t-test", スチューデントt-検定
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2023,
Rahulkumar J, Narayanamoorthi R, Vishnuram P, Bajaj M, Blazek V, Prokop L, Misak S
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2023,
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2023 6th International Conference on Advances in Science and Technology (ICAST), Mumbai, India. IEEE: pp. 638-642; ISBN 9798350359824
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2023,
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2023 26th International Conference on Computer and Information Technology (ICCIT), Cox's Bazar, Bangladesh. IEEE: pp. 1-6; ISBN 9798350359022
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2023,
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2023 9th International Engineering Conference on Sustainable Technology and Development (IEC), Erbil, Iraq. IEEE: pp. 32-37; ISBN 9798350335071
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2023,
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IEEE Trans Antennas Propag 71 (4): 3314-3323
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2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech), Kolkata, India. IEEE: pp. 1-6; ISBN 9798350328943
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2023,
Sharmandemola F, Halvani G, Jambarsang S, Mehrparvar AH
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2023,
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2023 IEEE 11th International Conference on Information, Communication and Networks (ICICN), Xi'an, China. IEEE: pp. 524-527; ISBN 9798350314021
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2023,
Senwen L, Zhizhong W, Yan R, Huagang W, Shaochuan C
2023 IEEE 11th International Conference on Information, Communication and Networks (ICICN), Xi'an, China. IEEE: pp. 432-440; ISBN 9798350314021
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2023,
Nwogbaga I, Kim AH, Camley BA
Phys Rev E 108 (6): 064411