2013 IEEE 1st International Conference on Condition Assessment Techniques in Electrical Systems (CATCON), Kolkata, India. IEEE: 77-81; ISBN 978-1-4799-0081-7
2013,
van Bree JWM, Geysen JJG, van Heesch EJM, Pemen AJM
2013,
Rago R, Salacone P, Caponecchia L, Sebastianelli A, Marcucci I, Calogero AE, Condorelli R, Vicari E, Morgia G, Favilla V, Cimino S, Arcoria AF, La Vignera S