The following terms were included:
RF, Hochfrequenz, HF, "radio frequency", 無線周波
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2015,
Nájera A, González-Rubio J, Arribas E
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2015,
Wang C, Zhou H, Wang L, Wang S, Xu X, Chen P, Wu K, Peng R, Hu X
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2015,
Pavlik M, Lisoň L, Kurimský P
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2015,
Bansal N, Dhaliwal AS, Mann KS
Sinha MM, Verma SS (eds.): Advanced Materials and Radiation Physics (AMRP 2015). AIP Conference Proceedings, volume 1675; AIP Publishing, Melville, NY; p. 030081; ISBN 978-0-7354-1322-1
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2015,
Pachuau L, Pachuau Z
IOSR Journal of Applied Physics 7 (1 Ver.1): 39-44
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Taehan Ŭisa Hyŏphoe chi (Journal of the Korean Medical Association) 58 (1): 42-48
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2015,
Lahiri BB, Bagavathiappan S, Soumya C, Jayakumar T, Philip J
Infrared Phys Tech 71: 242-251
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Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-104/15: 1-56
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ASTM,
ASTM F2052-15
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2015,
Anton E, Rotaru A, Covatariu D, Ciobica A, Timofte D, Popescu R, Anton C
Arch Biol Sci 67 (3): 895-897
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2015,
Shende VA, Patil KG
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2015,
Ock M, Lim SY, Kim WJ, Ryu HM, Yi N, Lee MS
Korean J Health Promot 15 (2): 39-46
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CRC Press, Boca Raton, FL, USA; ISBN 978-1-138-74903-0
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2015,
Pachon-García FT, Fernandez-Ortiz K, Paniagua-Sanchez JM
Measurement 63: 309-321
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.113 (11/2015): 1-20
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2015,
Björninen T, Yang F
IEEE Antennas Wirel Propag Lett 15: 794 - 797
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2015,
Blank M, Havas M, Kelley E, Lai H, Moskowitz JM
Eur J Oncol 20 (3/4): 180-182
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2015,
Walcott GP, Kroll MW, Ideker RE
J Interv Card Electrophysiol 42 (2): 83-89
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2015,
Ye L, Mei Q, Li M, Gu M, Ai Z, Tang K, Shi D, Wu X, Wang X, Zheng Y
Pain Med 16 (4): 782-790
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2015,
Ozen S, Helhel S, Carlak HF
PIERS Online: 1440-1443
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2015,
Nikolopoulos D, Koulougliotis D, Vogiannis E, Petraki E, Panagiotaras D, Yannakopoulos PH, Kottou S
J Phys Chem Biophys 5 (2): 1000176
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Int J Innov Res Eng Manag 2 (5): 71 - 76
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2015,
Purushothaman S, Raghavan S
2015 13th International Conference on Electromagnetic Interference and Compatibility (INCEMIC), Visakhapatnam, India. IEEE; ISBN 978-1-5090-5351-3
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2015,
Maeda K, Storey JG, Liddell PA, Gust D, Hore PJ, Wedge CJ, Timmel CR
Phys Chem Chem Phys 17 (5): 3550-3559
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2015,
Feng DX, McCauley JP, Morgan-Curtis FK, Salam RA, Pennell DR, Loveless ME, Dula AN
Br J Radiol 88 (1056): 20150633