Literature search results

5335 articles were found.

The following terms were included: Review, レビュー

• 2020, Dürrenberger G, Fröhlich J, Röösli M
  [Health effects of hybrid transmission lines. Literature review on the current state of the research] [info]
  1-114
• 2020, Stevenson R, Drummond-Smith I
  [details] Medical implications of Conducted Energy Devices in law enforcement [review]
  J Forensic Leg Med 73: 101948
• 2020, Kroll MW, Witte KK, Kunz SN, Luceri RM, Criscione JC
  Electrical weapons, hematocytes, and ischemic cardiovascular accidents [med./bio.]
  J Forensic Leg Med 73: 101990
• 2020, Balawender K, Orkisz S
  The impact of selected modifiable lifestyle factors on male fertility in the modern world [review]
  Cent European J Urol 73 (4): 563-568
• 2020, Sanches C, Stengel C, Godard J, Mertz J, Teichmann M, Migliaccio R, Valero-Cabré A
  Past, Present, and Future of Non-invasive Brain Stimulation Approaches to Treat Cognitive Impairment in Neurodegenerative Diseases: Time for a Comprehensive Critical Review [review]
  Front Aging Neurosci 12: 578339
• 2020, Jiang L, Cui H, Zhang C, Cao X, Gu N, Zhu Y, Wang J, Yang Z, Li C
  Repetitive Transcranial Magnetic Stimulation for Improving Cognitive Function in Patients With Mild Cognitive Impairment: A Systematic Review [review]
  Front Aging Neurosci 12: 593000
• 2020, Rimmele F, Jürgens TP
  Neuromodulation in primary headaches: current evidence and integration into clinical practice [basics]
  Curr Opin Neurol 33 (3): 329-337
• 2020, Meeker TJ, Jupudi R, Lenz FA, Greenspan JD
  New Developments in Non-invasive Brain Stimulation in Chronic Pain [review]
  Curr Phys Med Rehabil Rep 8 (3): 280-292
• 2020, Prathyusha KR, Pagonabarraga I, Kumar PBS
  Modification of lipid membrane compressibility induced by an electric field [tech./dosim.]
  Phys Rev E 102 (6): 062413
• 2020, Vahidnia R, John Dian F
  Radiation Safety Hazards of Cellular IoT Devices [basics]
  2020 11th IEEE Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), Vancouver, BC, Canada. IEEE: pp. 116-120; ISBN 978-1-7281-8417-3