Literature search results

9333 articles were found.

The following terms were included: power, Leistung, 仕事率

• 1992, Bell G, Marino A, Chesson A, Struve F
  Electrical states in the rabbit brain can be altered by light and electromagnetic fields [med./bio.]
  Brain Res 570 (1-2): 307-315
• 1992, Seaman RL, Beblo DA
  [details] Modification of acoustic startle by microwave pulses in the rat: a preliminary report [med./bio.]
  Bioelectromagnetics 13 (4): 323-328
• 1992, Inaba R, Shishido K, Okada A, Moroji T
  [details] Effects of whole body microwave exposure on the rat brain contents of biogenic amines [med./bio.]
  Eur J Appl Physiol Occup Physiol 65 (2): 124-128
• 1992, Stone R
  Polarized debate: EMFs and cancer [comment]
  Science 258 (5089): 1724-1725
• 1992, Austin DF
  Health and electromagnetic fields [comment]
  West J Med 156 (5): 538-539
• 1992, Bolshakov MA, Alekseev SI
  [details] Bursting responses of Lymnea neurons to microwave radiation [med./bio.]
  Bioelectromagnetics 13 (2): 119-129
• 1992, Phelan AM, Lange DG, Kues HA, Lutty GA
  Modification of membrane fluidity in melanin-containing cells by low-level microwave radiation [med./bio.]
  Bioelectromagnetics 13 (2): 131-146
• 1992, Klimovitsky VY, Loginov VA, Zagorskaya EA, Weissleder H, Drescher J, Hecht K
  [details] The evaluation of biological efficiency of electromagnetic fields generated by implanted radiotelemetric transmitters used in space research on animals [med./bio.]
  Physiologist 35 (1) Suppl: S248-S249
• 1991, Haubrich HJ, Brandes W, Machczynski V
  Calculation of Electric Effects of Overhead Transmission Lines on Human Beings [temp.]
  9th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 343-348; ISBN 978-1-5090-3194-8
• 1991, Eicher B, Stäger C, Herzig R, Urech M
  Are the Limits of Exposure to Electromagnetic Fields Valid for Human Health Only ? [temp.]
  9th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 355-358; ISBN 978-1-5090-3194-8