The following terms were included:
EMF, "Elektromagnetisches Feld", "electromagnetic field", 電磁界
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2016,
van Rhoon GC, Paulides MM, van Holthe JM, Franckena M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 359-362; ISBN 978-1-4577-0220-4
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2016,
Vincent M, Rossel O, Duffau H, Bonnetblanc F, Guiraud D
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 4543-4546; ISBN 978-1-4577-0220-4
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2016,
Mattei E, Lucano E, Censi F, Angelone LM, Calcagnini G
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 2361-2364; ISBN 978-1-4577-0220-4
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2016,
Kozlov M, Lucano E, Angelone LM
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 6242-6245; ISBN 978-1-4577-0220-4
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2016,
Aharonovich Y, Scheinowitz M, Zlochiver S
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 161-164; ISBN 978-1-4577-0220-4
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2016,
Wu J, Wang H, Zhang X, Zhang L, Tang J
2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI), Datong. IEEE; ISBN 978-1-5090-3711-7
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2016,
Restrepo AF, Tobar VE, Camargo RJ, Franco E, Pinedo CR, Gutierrez O
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 4193-4196; ISBN 978-1-4577-0220-4
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2016,
Demirci EA, Gümüşay M, Kaya A, Karaman O
2016 20th National Biomedical Engineering Meeting (BIYOMUT), Izmir. IEEE; ISBN 978-1-5090-5830-3
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2016,
Tuğlu MI, Gülbağça F, Sal DH, Sayğili S, Sönmez PK, Aydemi̇r I, Özkut M, Öztürk Ş, Gümüşay M, Kaya A, Keskin N
[2016 20th National Biomedical Engineering Meeting (BIYOMUT), Izmir]. IEEE; ISBN 978-1-5090-5830-3
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2016,
Xu CD, Cheng KWE, Zou Y, Ho HF, Wang XL
2016 International Symposium on Electrical Engineering (ISEE), Hong Kong, China. IEEE; ISBN 978-1-5090-5885-3