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Chang YC, Ahmed U, Jayaprakash N, Mughrabi I, Lin Q, Wu YC, Gerber M, Abbas A, Daytz A, Gabalski AH, Ashville J, Dokos S, Rieth L, Datta-Chaudhuri T, Tracey KJ, Guo T, Al-Abed Y, Zanos S
2022 4th International Conference on Electrical Engineering and Control Technologies (CEECT), Shanghai, China. IEEE: pp. 429-436; ISBN 978-1-6654-9900-2
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