The following terms were included:
Mittelwert, "arithmetischer Mittelwert", Mittel, "arithmetic mean", "mean value", mean, 算術平均, 平均値, 平均
-
2017,
Deniz ÖG, Kivrak EG, Kaplan AA, Altunkaynak BZ
J Microsc Ultrastruct 5 (4): 198-205
-
2017,
Kivrak EG, Altunkaynak BZ, Alkan I, Yurt KK, Kocaman A, Onger ME
J Microsc Ultrastruct 5 (4): 216-224
-
2017,
Brandão C, Vaz M, Brito IM, Ferreira B, Meireles R, Ramos S, Cabral L
Ann Burns Fire Disasters 30 (4): 268-271
-
2017,
Akural E, Järvimäki V, Korhonen R, Kautiainen H, Haanpää M
Scand J Pain 3 (3): 127-131
-
2017,
Dai R, Xie H, Hua W, Li XH, Li L
J Cosmet Laser Ther 19 (6): 337-344
-
2017,
Liu Z, Tang X, Wang D, Wei Z, Jin W, Deng C, Qi J
Zhongguo Xiu Fu Chong Jian Wai Ke Za Zhi 31 (9): 1106-1110
-
2017,
Williams B, Deaton T, Galarneau M, Dye J, Zieber T, Auten J
Mil Med 182 (9): e2017-e2023
-
2017,
Davarpanah Jazi S, Modolo J, Baker C, Villard S, Legros A
Int J Environ Res Public Health 14 (12): E1446
-
2017,
Gong F, Wei Z, Cong Y, Chi H, Yin B, Sun M
Technol Health Care 25 (S1): 387-397
-
2017,
Beaulieu LD, Massé-Alarie H, Camiré-Bernier S, Ribot-Ciscar É, Schneider C
Neurophysiol Clin 47 (4): 275-291
-
2017,
Nowrouzi-Kia B, Sharma B, Dignard C, Kerekes Z, Dumond J, Li A, Larivière M
Occup Med 67 (6): 442-447
-
2017,
Lucia U, Grisolia G, Ponzetto A, Silvagno F
J Theor Biol 429: 181-189
-
2017,
Babygirija R, Sood M, Kannampalli P, Sengupta JN, Miranda A
Neuroscience 356: 11 - 21
-
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE, Singapore, Singapore: pp. 1273-1277; ISBN 978-1-5386-1211-8
-
2017,
Hazime FA, Baptista AF, de Freitas DG, Monteiro RL, Maretto RL, Hasue RH, João SMA
Eur J Pain 21 (7): 1132-1143
-
2017 IEEE Conference on Antenna Measurements & Applications (CAMA), Tsukuba, Japan. IEEE, Tsukuba, Japan: pp. 142-143; ISBN 978-1-5090-5029-1
-
2017,
Tiryaki Ç, Haksal MC, Yazıcıoğlu MB, Çiftçi A, Esen O, Turgut HT, Yildirim A, Güven M
Ulus Travma Acil Cerrahi Derg 23 (3): 223-229
-
2017,
Shi J, Chakarothai J, Wang J, Wake K, Fujiwara O, Watanabe S
2017 IEEE 5th International Symposium on Electromagnetic Compatibility (EMC-Beijing), Beijing, China. IEEE; ISBN 978-1-5090-5186-1
-
2017,
Jakobs M, Schuh-Hofer S, Unterberg A, Ahmadi R
J Vis Exp (123): e55408
-
2017,
Devale MM, Kadakia GJ, Jain VG, Munot RP
Indian J Plast Surg 50 (2): 217-219
-
2017,
Jalilian H, Najafi K, Reza M, Khosravi Y, Zamanian Z
IJOH 9 (2): 105-112
-
2017,
Sannino A, Romeo S, Scarfì MR, Massa R, d'Angelo R, Petrillo A, Cerciello V, Fusco R, Zeni O
Front Public Health 5: 344
-
2017,
Baby NM, Koshy G, Mathew A
Indian J Endocrinol Metab 21 (6): 797-802
-
2017,
Chiaramello E, Fiocchi S, Ravazzani P, Parazzini M
Biomed Res Int 2017: 4672124
-
2017,
Santana TAA, de Andrade HD, Junior ISQ, de Holanda SM, da Silva JL, Fontgalland G, de Arimateia Pinto Magno J
2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC), Aguas de Lindoia, Brazil. IEEE; ISBN 978-1-5090-6242-3