The following terms were included:
Induktion, induktives, induction, 誘導
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2023,
Rocchi L, Spampinato DA, Pezzopane V, Orth M, Bisiacchi PS, Rothwell JC, Casula EP
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2023,
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2023,
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IEEE Sens J 23 (5): 4312-4326
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2023,
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J Clin Neurophysiol 40 (4): 371-377
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2023,
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2022,
Wang B, Xiong N, Sun Y, Zhang L, Li C, Li J, Wang Z, Chen Z, Zhang Y, Wang X
IEEE J Electromagn RF Microw Med Biol 6 (1): 123-130
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J Radiat Proc 40 (2): 42-53
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New Physics: Sae Mulli 72 (11): 835-840
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2022,
Ma L, Hao W, Feng WB, Cao LC, Qin LN, Wang Y, Liu MH, Wang NZ, Gao F, Guo JM, Du H, Yan HL
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2022,
Leniček I, Ferković L
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2022,
Guo F, Qian K, Li X, Deng H
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2022,
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2022 13th International Conference on Live Maintenance (ICOLIM), Turin, Italy. IEEE: pp. 1-5; ISBN 978-1-6654-7421-4
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J Radiat Proc 40 (5): 050601
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2022,
Dasari A, Xue J, Deb S
Nanomaterials 12 (5): 757
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2022,
Ali RA, Latif MH, Usman M
2022 5th International Conference on Energy Conservation and Efficiency (ICECE), Lahore, Pakistan. IEEE: pp. 1-13; ISBN 978-1-7281-8681-8
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2022,
Akter MK, Guo R, Islam MZ, Zheng J, Chen J
2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS), Waco, TX, USA. IEEE: pp. 1-5; ISBN 978-1-6654-8610-1
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2022,
Caramazza L, Paffi A, Liberti M, Apollonio F
2021 51st European Microwave Conference (EuMC), London, United Kingdom. IEEE: pp. 785-788; ISBN 978-1-6654-4721-8
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2022 International Conference on Applied Physics and Computing (ICAPC), Ottawa, ON, Canada. IEEE: pp. 104-106; ISBN 978-1-6654-6304-1
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2022,
Chehab MH, Khelil M, Salah CB
2022 IEEE 21st international Ccnference on Sciences and Techniques of Automatic Control and Computer Engineering (STA), Sousse, Tunisia. IEEE: pp. 67-72; ISBN 978-1-6654-8262-2
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2022,
So E, Yeon P, Chichilnisky EJ, Arbabian A
IEEE J Solid-State Circuits 57 (11): 3429-3441
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2022,
Ramirez-Bettoni E, Nemeth B
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-9; ISBN 978-1-6654-7864-9
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2022,
Ibrahim A, Tetik E, Karamzadeh S
2022 30th Signal Processing and Communications Applications Conference (SIU), Safranbolu, Turkey. IEEE: pp. 1-4; ISBN 978-1-6654-5093-5