The following terms were included:
Hochspannung, "high voltage", 高電圧
-
1999,
Acosta AS, Azarcon-Lim J, Ramirez AT
Ann N Y Acad Sci 888: 12-18
-
Ann N Y Acad Sci 888: 317-326
-
1999,
Garcia-Sanchez V, Gomez Morell P
Burns 25 (4): 357-360
-
1999,
Rai J, Jeschke MG, Barrow RE, Herndon DN
J Trauma 46 (5): 933-936
-
1999,
Pliskin NH, Fink J, Malina A, Moran S, Kelley KM, Capelli-Schellpfeffer M, Lee R
Ann N Y Acad Sci 888: 140-149
-
Crit Care Clin 15 (2): 319-331
-
1999,
Gustrau F, Bahr A, Rittweger M, Goltz S, Eggert S
IEEE Trans Microw Theory Tech 41 (4): 480-486
-
1999,
Hofmann F, Ohnimus H, Scheller C, Strupp W, Zimmermann U, Jassoy C
J Membr Biol 169 (2): 103-109
-
Radiat Prot Dosimetry 86 (3): 217-220
-
1999,
McLaughlin JP, Gath G
Radiat Prot Dosimetry 82 (4): 257-262
-
1999,
Chen T, Langer R, Weaver JC
Bioelectrochem Bioenerg 48 (1): 181-192
-
1999,
Saito K, Kinoshita Y, Hosaka M
Int J Urol 6 (4): 196-199
-
1999,
Brandisky K, Daskalov I
Bioelectrochem Bioenerg 48 (1): 201-208
-
Biomed Tech 44 (9): 232-236
-
1999,
Sakakibara Y, Mitsui T
Jpn Heart J 40 (6): 737-743
-
IEEE Trans Biomed Eng 46 (12): 1426-1431
-
1999,
Sliwinska-Kowalska M
Med Pr Work Health Saf 50 (6): 581-591
-
1999,
Fews AP, Henshaw DL, Wilding RJ, Keitch PA
Int J Radiat Biol 75 (12): 1523-1531
-
1999,
Fews AP, Henshaw DL, Keitch PA, Close JJ, Wilding RJ
Int J Radiat Biol 75 (12): 1505-1521
-
1999,
Olshan AF, De Roos AJ, Teschke K, Neglia JP, Stram DO, Pollock BH, Castleberry RP
Cancer Causes Control 10 (6): 539-549
-
Teratology 59 (4): 292-298
-
1999,
Institute of Electrical and Electronics Engineers (IEEE) - Engineering in Medicine and Biology Society (EMBS) Committee on Man and Radiation (COMAR)
IEEE Eng Med Biol Mag 18 (1): 88-90
-
1998,
Isaka K, Nisihimura R, Hayashi N, Arase S, Takiwaki H, Osaki K, Takahashi K, K Doge, Sakaino M
EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 204-207; ISBN 9798331500016
-
1998,
Crotti G, Farina G, Cena E, Ribaldone P
EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 150-155; ISBN 9798331500016
-
1998,
Herrid M, Fei G, Shorgan B
J Electrost 44 (1-2): 85-90