-
2010,
Rubin GJ, Nieto-Hernandez R, Wessely S
Bioelectromagnetics 31 (1): 1-11
-
Bioelectromagnetics 31 (2): 113-119
-
2010,
Robertson JA, Theberge J, Weller J, Drost DJ, Prato FS, Thomas AW
J R Soc Interface 7 (44): 467-473
-
2010,
Hallberg O, Johansson O
Pathophysiology 17 (3): 157-160
-
2010,
Kheifets L, Renew D, Sias G, Swanson J
Bioelectromagnetics 31 (2): 89-101
-
2010,
McKay JC, Corbacio M, Tyml K, Prato FS, Thomas AW
Bioelectromagnetics 31 (1): 64-76
-
J Orthop Res 28 (2): 265-270
-
2010,
McLeod BR, Sandvik EL
Bioelectromagnetics 31 (1): 56-63
-
Bioelectromagnetics 31 (1): 77-84
-
Ecotoxicol Environ Saf 73 (1): 62-66
-
2010,
Trelles MA, van der Lugt C, Mordon S, Ribe A, Al-Zarouni M
Lasers Med Sci 25 (2): 191-195
-
2010,
Chang CH, Loo ST, Liu HL, Fang HW, Lin HY
J Biomed Mater Res A 92 (3): 843-851
-
2010,
Salama N, Kishimoto T, Kanayama HO
Int J Androl 33 (1): 88-94
-
2009,
Razmadze A, Shoshiashvili L, Kakulia D, Zaridze R, Bit-Babik G, Faraone A
Electromagnetics 29 (1): 77-90
-
2009,
Hirata A, Sugiyama H, Fujiwara O
Prog Electromagn Res 99: 53-70
-
2009,
Erdoğan A, Ipekcioglu E
Kafkas Univ Vet Fak Derg 15 (5): 739-744
-
Air Force Research Laboratory (AFRL); Roach WP (ed.),
Interim technical reptort (Nov 2007-Feb 2008), AFRL-RH-BR-TR-2010-0065: 1-398
-
Romanian J Biophys 19 (2): 149-158
-
2009,
Dou Y, Wang DW, Zhang MF, Peng RY, Zhang JS, Deng JX, Guo YH
Zhonghua Fang She Yi Xue Yu Fang Hu Za Zhi 29 (1): 114-116
-
2009,
Yitzhak NM, Ruppin R, Hareuveny R
Phys Med Biol 54 (13): 4037-4049
-
2009,
Atay T, Aslan A, Heybeli N, Aydoğan NH, Baydar ML, Ermol C, Yildiz M
Trakya Univ Tip Fak Derg 26 (4): 292-296
-
2009,
Meric F, Dasdag S, Dasdag MM
J Int Adv Otol 5 (3): 356-360
-
2009,
Aguilar CH, Dominguez-Pacheco A, Carballo Carballo A, Cruz-Orea A, Ivanov R, López Bonilla JL, Valcarcel Montañez JP
Acta Agroph 14 (1): 7-17
-
2009,
Nelson DA, Charbonnel S, Curran AR, Marttila EA, Fiala D, Mason PA, Ziriax JM
J Biomech Eng 131 (4): 041003
-
2009,
Ragha LK, Bhatia MS
2009 Annual IEEE India Conference, Ahmedabad, India. IEEE: pp. 1-4; ISBN 978-1-4244-4859-3