2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: pp. 187-192; ISBN 978-1-5386-6622-7
2018,
Khalifeh JM, Zohny Z, MacEwan M, Stephen M, Johnston W, Gamble P, Zeng Y, Yan Y, Ray WZ