-
1999,
Zhang Z, Li T, Guo X
Zhonghua Zheng Xing Shao Shang Wai Ke Za Zhi 15 (6): 460-461
-
1999,
Chen G, Xu X, Chen H
Zhonghua Zheng Xing Shao Shang Wai Ke Za Zhi 15 (5): 369-370
-
1999,
Yan D, Fan C, Yuan S
Zhonghua Zheng Xing Shao Shang Wai Ke Za Zhi 15 (5): 371-372
-
1999,
Shen Z, Xiang D, Wang N
Zhonghua Zheng Xing Shao Shang Wai Ke Za Zhi 15 (2): 115-116
-
1999,
Tredget EE, Shankowsky HA, Tilley WA
Ann N Y Acad Sci 888: 75-87
-
1999,
Acosta AS, Azarcon-Lim J, Ramirez AT
Ann N Y Acad Sci 888: 12-18
-
1999,
Garcia-Sanchez V, Gomez Morell P
Burns 25 (4): 357-360
-
Plast Reconstr Surg 104 (7): 2267-2268
-
1999,
Man D, Man B, Plosker H
Plast Reconstr Surg 104 (7): 2261-2266
-
1999,
Weber BP, Neuburger J, Goldring JE, Santogrossi T, Koestler H, Battmer RD, Lenarz T
Ann Otol Rhinol Laryngol Suppl 177: 22-26
-
1999,
Merello M, Nouzeilles MI, Kuzis G, Cammarota A, Sabe L, Betti O, Starkstein S, Leiguarda R
Mov Disord 14 (1): 50-56
-
1999,
Barcia-Salorio JL, Roldan P, Talamantes F, Pascual-Leone A
Stereotact Funct Neurosurg 72 (2-4): 202-207
-
1999,
Pliquett F, Pliquett U
Ann N Y Acad Sci 873: 227-238
-
1999,
Albertini A, Zucchini P, Noera G, Cadossi R, Napoleone CP, Pierangeli A
Bioelectromagnetics 20 (6): 372-377
-
1999,
Goodwin CB, Brighton CT, Guyer RD, Johnson JR, Light KI, Yuan HA
Spine 24 (13): 1349-1356
-
1999,
Borgens RB, Toombs JP, Breur G, Widmer WR, Waters D, Harbath AM, March P, Adams LG
J Neurotrauma 16 (7): 639-657
-
1999,
Eterovic D, Juretic-Kuscic L, Capkun V, Dujic Z
J Urol 161 (1): 39-44
-
1999,
Robotti E, Zimbler AG, Kenna D, Grossman JA
J Hand Surg Br 24 (1): 56-58
-
Am J Knee Surg 12 (3): 181-185
-
1999,
Hamza MA, White PF, Ahmed HE, Ghoname EA
Anesthesiology 91 (5): 1232-1238
-
1999,
Madigan JD, Choudhri AF, Chen J, Spotnitz HM, Oz MC, Edwards N
Ann Surg 230 (5): 639-647
-
1999,
Kanal E, Shellock FG
Radiology 210 (2): 563-565
-
Bioelectromagnetics 20 Suppl 4: 120-132
-
1999,
Mooney V, McDermott KL, Song J
J Spinal Disord 12 (5): 380-385
-
1998,
Guimarães CAC, Garcia RO, Raizer A
EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 689-694; ISBN 9798331500016