The following terms were included:
電界, "Elektrisches Feld", EF, "electric field"
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2021,
Tanatarec B, Šimunić D
2021 44th International Convention on Information, Communication and Electronic Technology (MIPRO), Opatija, Croatia. IEEE: 523-526; ISBN 978-1-6654-4761-4
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2021,
Cheah YJ, Buyong MR, Mohd Yunus MH
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2021,
Perera PGT, Todorova N, Vilagosh Z, Bazaka O, Nguyen THP, Bazaka K, Crawford RJ, Croft RJ, Yarovsky I, Ivanova EP
RSC Adv 11 (50): 31408-31420
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2021,
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IEEE Ind Appl Mag 27 (6): 76-81
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2021,
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2021,
Kettel EF, Thaxter C, Oppel S, Carryer A, Innis L, Pearce-Higgins JW
J Environ Manage 302 Pt A: 114063
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2021,
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Am J Cancer Res 11 (9): 4582-4594
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2021,
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Front Bioeng Biotechnol 9: 757906
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2021,
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IEEE Access 9: 146471-146477
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2021,
Barati M, Darvishi B, Javidi MA, Mohammadian A, Shariatpanahi SP, Eisavand MR, Madjid Ansari A
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2021,
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2021,
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2021 22nd International Conference on Computational Problems of Electrical Engineering (CPEE), Hrádek u Sušice, Czech Republic. IEEE: 1-4; ISBN 978-1-7281-8431-9
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2021,
Judáková Z, Janoušek L, Čarnecká L, Oreničová D
2021 22nd International Conference on Computational Problems of Electrical Engineering (CPEE), Hrádek u Sušice, Czech Republic. IEEE: 1-4; ISBN 978-1-7281-8431-9
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2021,
Nurmi S, Karttunen J, Souza VH, Ilmoniemi RJ, Nieminen JO
J Neural Eng 18 (6): 066003
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2021,
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2021,
De Borre E, Joseph W, Aminzadeh R, Müller P, Boone MN, Josipovic I, Hashemizadeh S, Kuster N, Kühn S, Thielens A
PLoS Comput Biol 17 (10): e1009460
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2021,
Ajibare AT, Ramotsoela D, Akinyemi LA, Oladejo SO
2021 IEEE AFRICON, Arusha, Tanzania, United Republic of. IEEE: 1-6; ISBN 978-1-6654-4748-5
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2021,
Grebeneva OV, Rybalkina DH, Ibrayeva LK, Shadetova AZ, Drobchenko EA, Aleshina NY
Russian Open Medical Journal: ROMJ 10 (3): e0319
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2021,
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Front Oncol 11: 671972
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2021,
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J Vac Sci Technol B Nanotechnol Microelectron 39 (6): 063202
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2021,
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2021,
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2021,
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2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Raleigh, NC, USA. IEEE: 381-385; ISBN 978-1-6654-4889-5
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2021 8th International Conference on Signal Processing and Integrated Networks (SPIN), Noida, India. IEEE: 98-101; ISBN 978-1-6654-0255-2