The following terms were included:
電界強度, "Elektrische Feldstärke", "electric field strength"
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2018,
Ma L, Zhang X, Ying BA, Wu L
Li Y, Gao L, Xu WL (eds.): 11th Textile Bioengineering and Informatics Symposium proceedings (TBIS 2018) : Manchester, United Kingdom, 25-28 July 2018. Curran Associates, Inc., Red Hook, NY; pp. 205-211; ISBN 978-1-5108-7035-2
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2018,
Wu YX, Yu HY, Liu ZW
IEEE Trans Magn 54 (11): 5001105
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2018,
Zradzinski P, Karpowicz J, Gryz K, Leszko W
Eskola H, Väisänen O, Viik J, Hyttinen J (eds.): EMBEC & NBC 2017: Joint Conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 2017. IFMBE Proceedings, volume 65; Springer, Singapore; pp. 1008-1011; ISBN 978-981-10-5121-0
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2018,
Zhou H, Sun L, Yang Y, Liu C, Liu T, Xie P, Ma L
J For Res (Harbin) 29 (5): 1415-1422
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2018,
Paras SD, Gajanin RB, Manojlovi ML, Ruzic ZN
Eskola H, Väisänen O, Viik J, Hyttinen J (eds.): EMBEC & NBC 2017: Joint Conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 2017. IFMBE Proceedings, volume 65; Springer, Singapore; pp. 711-714; ISBN 978-981-10-5121-0
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2018,
Kljajic D, Djuric N
2018 26th Telecommunications Forum (TELFOR), Belgrade, Serbia. IEEE: pp. 420-425; ISBN 978-1-5386-7172-6
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2018 26th Telecommunications Forum (TELFOR), Belgrade, Serbia. IEEE: pp. 1-4; ISBN 978-1-5386-7172-6
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2018,
Mazurek PA, Joanna M, Joanna K, Radoslaw G, Artur W
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: pp. 159-162; ISBN 978-1-5386-6937-2
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2018,
Liu X, Yin X, Yang Q
2018 International Conference on Intelligent Transportation, Big Data & Smart City (ICITBS), Xiamen, China. IEEE: pp. 760-763; ISBN 978-1-5386-4202-3
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[2018 2nd International Symposium on Multidisciplinary Studies and Innovative Technologies (ISMSIT)], Ankara, Turkey. IEEE: pp. 1-4; ISBN 978-1-5386-4185-9