The following terms were included:
米国電気電子学会, "Institute of Electrical and Electronics Engineers", IEEE
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2006,
Sunderam S, Chernyy N, Mason J, Peixoto N, Weinstein SL, Schiff SJ, Gluckman BJ
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 1612-1615; ISBN 978-1-4244-0032-4
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2006,
Bikson M, Radman T, Datta A
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 1616-1619; ISBN 978-1-4244-0032-4
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2006,
Feitosa M, Fontana E
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 4655-4658; ISBN 978-1-4244-0032-4
-
2006,
Radman T, Parra L, Bikson M
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 4949-4952; ISBN 978-1-4244-0032-4
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2006,
Rey JI, Jaroszeski MJ, Gilbert RA
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 5617-5620; ISBN 978-1-4244-0032-4
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2006,
Nakano A, Kato K, Tsuchiya K, Nakazawa K, Yabuhara T, Uzuka T, Takahashi H
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 4058-4061; ISBN 978-1-4244-0032-4
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2006,
Yabuhara T, Kato K, Tsuchiya K, Shigihara T, Uzuka T, Takahashi H
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 5161-5164; ISBN 978-1-4244-0032-4
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2006,
Lass J, Rodina A, Riipulk J, Hinrikus H, Bachmann T
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 2924-2927; ISBN 978-1-4244-0032-4
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2006,
Bachmann M, Lass J, Kalda J, Sakki M, Tomson R, Tuulik V, Hinrikus H
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 1597-1600; ISBN 978-1-4244-0032-4
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2006,
Sachse FB, Cole MJ, Stinstra JG
2006 International Conference of the IEEE Engineering in Medicine and Biology Society, New York, NY, USA. IEEE: 2554-2557; ISBN 978-1-4244-0032-4