The following terms were included:
米国電気電子学会, "Institute of Electrical and Electronics Engineers", IEEE
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2022,
Silla G, Bastianelli L, Colella E, Moglie F, Primiani VM
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 151-156; ISBN 978-1-6654-0789-2
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 145-150; ISBN 978-1-6654-0789-2
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2022,
Hammen L, Pichon L, Le Bihan Y, Bensetti M, Fleury G
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 114-119; ISBN 978-1-6654-0789-2
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 311-316; ISBN 978-1-6654-0789-2
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2022,
Esmaeili H, Yang C, Schuster C
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 467-472; ISBN 978-1-6654-0789-2
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2022,
Marina P, Suárez SD, Hernández JA, Febles VM, Rabassa LE, Ramos V
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 519-524; ISBN 978-1-6654-0789-2
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2022,
Johansson M, Carlsson J
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 137-140; ISBN 978-1-6654-0789-2
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2022,
Wang Y, Yan S, Huang B
IEEE Trans Antennas Propag 70 (8): 6537-6550
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2022,
Herssens H, Toribio D, De Borre E, Thielens A
IEEE Trans Antennas Propag 70 (11): 11070-11078
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2022,
Varheenmaa H, Ylä-Oijala P, Lehtovuori A, Viikari V
IEEE Trans Antennas Propag 70 (12): 12282-12287
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2022,
Islam S, Zada M, Yoo H
IEEE Trans Antennas Propag 70 (12): 11629-11638
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2022,
Mahalec R, Malarić K
2022 International Symposium ELMAR, Zadar, Croatia. IEEE: 19-22; ISBN 978-1-6654-7004-9
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2022,
Chiaraviglio L, Lodovisi C, Franci D, Pavoncello S, Aureli T
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Yatma DC, Aleksandrovitsh MA, Viktorovna KM
2022 International Conference on Electrical, Computer and Energy Technologies (ICECET), Prague, Czech Republic. IEEE: 1-6; ISBN 978-1-6654-7088-9
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2022,
Lawler NB, Evans CW, Romanenko S, Chaudhari N, Fear M, Wood F, Smith NM, Iyer KS, Wallace VP
2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft, Netherlands. IEEE: 1-2; ISBN 978-1-7281-9428-8
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2022,
Varheenmaa H, Lehtovuori A, Ylä-Oijala P, Viikari V
IEEE Open Journal of Antennas and Propagation 3: 1154-1160
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2022,
Hough CM, Purschke DN, Bell C, Kalra AP, Oliva PJ, Huang C, Tuszynski JA, Warkentin BJ, Hegmann FA
2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft, Netherlands. IEEE: 1-3; ISBN 978-1-7281-9428-8
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2022,
Curreli N, Lodi MB, Melis A, Puddu C, Casu S, Fanti A, Djuric N, Retico A, Mazzarella G
IEEE Access 10: 104589-104597
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2022,
Zhou C, Synder DP, Epstein B, Robinson ZT, Jin GY, Tang PY, Polcawich RG, Roper M
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Spokane, WA, USA. IEEE: 439-442; ISBN 978-1-6654-0930-8
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2022,
Betta G, Capriglione D, Cerro G, Miele G, Migliore MD, Šuka D
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Sârbu A, Vatamanu D, Miclăus S, Mihai G, Şorecău M, Şorecău E, Bechet P
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-5; ISBN 978-1-6654-8363-6
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2022,
Adda S, Aureli T, Cassano T, Franci D, Migliore MD, Pasquino N, Pavoncello S, Schettino F, Schirone M
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Azaro R, Franchelli R, Gandolfo A
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-5; ISBN 978-1-6654-8363-6
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2022,
Migliore MD, Franci D, Pavoncello S, Aureli T, Merli E, Lodovisi C, Chiaraviglio L, Schettino F
IEEE Access 10: 103438-103446
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2022,
Djuric N, Kljajic D, Gavrilov T, Markovic Golubovic N, Djuric S
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6