The following terms were included:
米国電気電子学会, "Institute of Electrical and Electronics Engineers", IEEE
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2024,
Wang H, Xu S, Yu J, Lu S, Zhu Y, Du P
2024 5th International Seminar on Artificial Intelligence, Networking and Information Technology (AINIT), Nanjing, China. volume 5; IEEE, China: pp. 1926-1929; ISBN 9798350385564
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2024,
Colella M, Biscarini M, Pellegrino G, de Meis M, Cavagnaro M, Apollonio F, Liberti M
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257
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2024,
Costanzo S, Buonanno G
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257
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2024,
Comelli M, Zoppetti N, Burriesci G, D’Agostino S, Bogi A, Di Liberto R
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257
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2024,
Hasan NI, Dannhauer M, Wang D, Deng ZD, Gornez LJ
2024 International Applied Computational Electromagnetics Society Symposium (ACES), Orlando, FL, USA. IEEE, Florida: pp. 1-2; ISBN 9798350362978
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2024,
Burriesci G, Mainero Rocca L, Rubonello G, Comelli M, Valentini M
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257
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2024,
Peterjan DB, Ribas FO, Bell D, Bouga M, Fröhlich J, Hatjina F, Huss A, Stavrinides M, Thanou Z, Tsagkarakis A, Varnava A, Zahner M, Raman S, Thielens A
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257
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2024,
Liu J, Zhang Y, Chikha WB, Wang S, Samaras T, Jawad O, Ourak L, Conil E, Wiart J
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-3; ISBN 9798350360257
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2024,
Herssens H, Thielens A
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257
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2024,
Censi F, Vivarelli C, Mattei E, Calcagnini G, Bogi A, Comelli M, Zoppetti N, Burriesci G, D’Agostino S, Falsaperla R
2024 4th URSI Atlantic Radio Science Meeting (AT-RASC), Meloneras, Spain. IEEE, Spanien: pp. 1-4; ISBN 9798350360257