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2023,
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2023,
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2022,
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2022,
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2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: pp. 1080-1081; ISBN 978-1-6654-9659-9
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2022,
Youssef K, Abo-Zahhad M, Abd El-Malek A
2022 10th International Japan-Africa Conference on Electronics, Communications, and Computations (JAC-ECC), Alexandria, Egypt. IEEE: pp. 206-211; ISBN 978-1-6654-6464-2
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2022,
Gordon LB, Liechty J, Bradley J, Merrill L, Gauss H
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-8; ISBN 978-1-6654-7864-9
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2022,
Yu H, Du B, Guo L, Xu G
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2022,
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2022,
Tamura M, Segawa T, Matsumoto M
2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan. IEEE: pp. 58-60; ISBN 978-1-6654-5108-6
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2022 International Conference on Applied Physics and Computing (ICAPC), Ottawa, ON, Canada. IEEE: pp. 104-106; ISBN 978-1-6654-6304-1
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2022,
Kang W, Ju C, Joo J, Lee J, Shon YM, Park SM
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2022,
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2022 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Harbin, China. IEEE: pp. 1-3; ISBN 978-1-6654-8227-1
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2022,
Liu Z, Li X, Qin Z, Yu H, Wang Z, Zhu S, Yao L
2022 4th International Conference on Electrical Engineering and Control Technologies (CEECT), Shanghai, China. IEEE: pp. 429-436; ISBN 978-1-6654-9900-2
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2022,
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2022 16th European Conference on Antennas and Propagation (EuCAP), Madrid, Spain. IEEE: pp. 1-4; ISBN 978-1-6654-1604-7
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2022,
Portosi V, Loconsole AM, Valori M, Marrocco V, Bonelli F, Pascazio G, Lampignano V, Fasano A, Prudenzano F
2022 Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy. IEEE: pp. 315-319; ISBN 978-1-6654-7111-4
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2022,
Alvarez-Botero GA, Hernandez-Gomez YK, Lobato-Morales H
IEEE Trans Instrum Meas 71: 5502609
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2022,
Afjei E, Siadatan A, Naghash R, Gholipour A, Rezaei-Zare A
2022 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM), Sorrento, Italy. IEEE: pp. 402-406; ISBN 978-1-6654-8460-2
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2022,
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2022 36th International Conference on Lightning Protection (ICLP), Cape Town, South Africa. IEEE: pp. 572-577; ISBN 978-1-6654-9025-2
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