Literature search results
1870 articles were found.
The following terms were included:
基地局, "Base Transceiver Station", "Sendemast für Mobilfunk", Mobilfunkbasisstation, Mobilfunkantenne, Mobilfunkmast, Basisstation, BTS, "mobile phone relay station", "base station", 携帯電話中継局
2022 ,
Djuric N, Kljajic D, Kavecan N, Otasevic V, Djuric S
2022 13th International Symposium on Communication Systems, Networks and Digital Signal Processing (CSNDSP) , Porto, Portugal. IEEE: pp. 258-262; ISBN 978-1-6654-1045-8
2022 International Symposium on Electromagnetic Compatibility – EMC Europe , Gothenburg, Sweden. IEEE: pp. 145-150; ISBN 978-1-6654-0789-2
2022 ,
Chiaraviglio L, Lodovisi C, Franci D, Pavoncello S, Aureli T
2022 IEEE International Symposium on Measurements & Networking (M&N) , Padua, Italy. IEEE: pp. 1-6; ISBN 978-1-6654-8363-6
2022 ,
Betta G, Capriglione D, Cerro G, Miele G, Migliore MD, Šuka D
2022 IEEE International Symposium on Measurements & Networking (M&N) , Padua, Italy. IEEE: pp. 1-6; ISBN 978-1-6654-8363-6
2022 ,
Adda S, Aureli T, Cassano T, Franci D, Migliore MD, Pasquino N, Pavoncello S, Schettino F, Schirone M
2022 IEEE International Symposium on Measurements & Networking (M&N) , Padua, Italy. IEEE: pp. 1-6; ISBN 978-1-6654-8363-6
2022 ,
Migliore MD, Franci D, Pavoncello S, Aureli T, Merli E, Lodovisi C, Chiaraviglio L, Schettino F
IEEE Access 10: 103438-103446
2022 ,
Djuric N, Kljajic D, Gavrilov T, Otasevic V, Djuric S
2022 IEEE International Symposium on Measurements & Networking (M&N) , Padua, Italy. IEEE: pp. 1-6; ISBN 978-1-6654-8363-6
2022 ,
Chiaraviglio L, Lodovisi C, Franci D, Grillo E, Pavoncello S, Aureli T, Blefari-Melazzi N, Alouini MS
IEEE Open J Commun Soc 3: 1592-1614
2022 ,
Patrício S, Correia LM, Gomes M
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI) , Denver, CO, USA. IEEE: pp. 1280-1281; ISBN 978-1-6654-9659-9
2022 ,
Duque JL, Arévalo JE, Patiño M, Vargas JC, Pérez MR, Román FJ, Araque JL
2022 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium) , Denver, CO, USA. IEEE: pp. 27-28; ISBN 978-1-6654-3151-4