The following terms were included:
低電圧, Niederspannung, "low voltage"
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Kroll MW, Kroll LC, Panescu D, Perkins PE, Andrews CJ
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: pp. 1769-1775; ISBN 978-1-5386-1312-2
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McInnes JA, Cleland H, Tracy LM, Darton A, Wood FM, Perrett T, Gabbe BJ
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Zhu LL, Tong F, Liang Y, Lopsong TZ, Huang WS, Liu YL, Zhou YW
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Chawla G, Dutt N, Ramniwas, Chauhan N, Sharma V
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2019,
Handa A, Tendolkar MS, Singh S, Gupta PN
BMJ Case Rep 12 (8): e230590
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Sharma A, Reddy YCVG, Shetty AP, Kader SMA
Indian J Ophthalmol 67 (9): 1497-1500
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Int J Radiat Biol 95 (11): 1573-1580
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Kasas-Lazetic K, Mijatovic G, Herceg D, Djuric N, Prsa M
2019 8th International Conference on Modern Power Systems (MPS), Cluj Napoca, Romania. IEEE: pp. 1-4; ISBN 978-1-7281-0751-6
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Araneo R, Dehghanian P, Mitolo M
2019 IEEE/IAS 55th Industrial and Commercial Power Systems Technical Conference (I&CPS), Calgary, AB, Canada. IEEE: pp. 1-7; ISBN 978-1-5386-7552-6
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Behera C, Sikary AK, Rautji R, Gupta SK
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Kroll MW, Ritter MB, Perkins PE, Shams L, Andrews CJ
J Emerg Med 56 (5): e71-e79
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Pilecky D, Vamos M, Bogyi P, Muk B, Stauder D, Racz H, Nyolczas N, Duray GZ, Zacher G, Zima E
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Crespi CM, Swanson J, Vergara XP, Kheifets L
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Daskal Y, Beicker A, Dudkiewicz M, Kessel B
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN VDE 0100-410 VDE 0100-410:2018-10
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2018 IEEE Petroleum and Chemical Industry Technical Conference (PCIC), Cincinnati, OH, USA. IEEE: pp. 463-472; ISBN 978-1-5386-4271-9
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2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
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Pabst O, Martinsen ØG, Chua L
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2018 IEEE IAS Electrical Safety Workshop (ESW), Fort Worth, TX, USA. IEEE: pp. 1-8; ISBN 978-1-5386-1560-7
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2018 IEEE Symposium on Product Compliance Engineering (ISPCE), San Jose, CA, USA. IEEE: pp. 1-6; ISBN 978-1-5386-3433-2
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Thomée S, Jakobsson K
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Ready FL, Gebremedhem YD, Worku M, Mehta K, Eshte M, GoldenMerry YL, Nwariaku FE, Wolf SE, Phelan HA
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He F, Luo PF, Tang T, Zhang F, Fang H, Ji SZ, Sun Y, Wu GS, Pan BH, Huo ZB, Wang GY, Xia ZF
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