The following terms were included:
ハザード, Gefährdungspotenzial, Hazard
-
2020,
Song S, Zheng J, Wang Y, Wang Q, Kainz W, Long SA, Chen J
IEEE Trans Microw Theory Tech 68 (12): 5423-5431
-
IEEE Microw Mag 21 (9): 16-19
-
IEEE Antennas Propag Mag 62 (5): 119
-
2020,
Michalowska J, Wac-Włodarczyk A, Kozieł J
J Ecol Eng 21 (1): 224-230
-
2020,
Aksenov V, Zavyalov A, Chaplygin V, Sorokina E
E3S Web Conf 157: 04013
-
2020,
Zhang W, Song G, Zhao Q, Qi X
2020 6th Global Electromagnetic Compatibility Conference (GEMCCON), XI'AN, China. IEEE: pp. 1-4; ISBN 978-1-7281-8464-7
-
2020,
Gascho D, Tappero C, Zoelch N, Deininger-Czermak E, Richter H, Thali MJ, Schaerli S
Forensic Sci Med Pathol 16 (1): 20-31
-
2020,
Petrov PK, Velev GT, Ivanov KM, Varbov TK
2020 7th International Conference on Energy Efficiency and Agricultural Engineering (EE&AE), Ruse, Bulgaria. IEEE: pp. 1-5; ISBN 978-1-7281-0363-1
-
2020 IEEE 15th International Conference on Industrial and Information Systems (ICIIS), RUPNAGAR, India. IEEE: pp. 567-570; ISBN 978-1-7281-8525-5
-
2020,
Meenu L, Aiswarya S, Menon SK
2020 5th International Conference on Computing, Communication and Security (ICCCS), Patna, India. IEEE: pp. 1-4; ISBN 978-1-7281-9181-2
-
2020,
Camponogara M, Marchesan APG, Bernardon DP, Marchesan TB, Pepe FC, dos Santos GJG, de Chiara LM
2020 IEEE PES Transmission & Distribution Conference and Exhibition - Latin America (T&D LA), Montevideo, Uruguay. IEEE: pp. 1-6; ISBN 978-1-7281-4156-5
-
2020,
Vahidnia R, John Dian F
2020 11th IEEE Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), Vancouver, BC, Canada. IEEE: pp. 116-120; ISBN 978-1-7281-8417-3
-
2020,
Zradziński P, Karpowicz J, Gryz K, Morzyński L, Młyński R, Swidziński A, Godziszewski K, Ramos V
Sensors 20 (24): E7131
-
2020,
Al-Khlaiwi TM, Habib SS, Meo SA, Alqhtani MS, Ogailan AA
Pak J Med Sci 36 (7): 1628-1633
-
2020,
Ramos V, Trillo AM, Suarez OJ, Suarez S, Febles VM, Rabassa LE, Karpowicz J, Fernandez de Aldecoa JC, Hernandez JA
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: pp. 1-5; ISBN 978-1-7281-5580-7
-
2020,
Asadi R, Aliakbarian H, Khayambashi G, Majdolashrafi P
IEEE Electromagn Compat Mag 9 (3): 45-54
-
2020,
Iyyanki M, Jayanthi P, Singh D, Tumula S, Megham P
2020 International Conference on Communication and Signal Processing (ICCSP), Chennai, India. IEEE: pp. 1250-1255; ISBN 978-1-7281-4989-9
-
2020,
Bagheri Hosseinabadi M, Khanjani N, Ebrahimi MH, Biganeh J
Radiat Prot Dosimetry 190 (3): 289-296
-
2020,
Freudenstein F, Croft RJ, Wiedemann PM, Verrender A, Böhmert C, Loughran SP
Environ Res 190: 109934
-
2020,
Gryz K, Karpowicz J, Zradziński P
Bioelectromagnetics 41 (7): 500-510
-
2020,
Biagi L, Gagliardi V, Retico A, Marletta M, Aringhieri G, Tiberi G, Campanella F, Tosetti M
2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Bari, Italy. IEEE: pp. 1-5; ISBN 978-1-7281-5387-2
-
2020,
Foster KR, Ziskin MC, Balzano Q, Hirata A
IEEE Access 8: 130239-130251
-
2020,
Ershov AM, Khlopova AV, Sidorov AI
2020 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM), Sochi, Russia. IEEE: pp. 1-5; ISBN 978-1-7281-4591-4
-
2020,
Kimsa-Dudek M, Synowiec-Wojtarowicz A, Krawczyk A, Kruszniewska-Rajs C, Gawron S, Paul-Samojedny M, Gola J
J Environ Sci Health A Tox Hazard Subst Environ Eng 55 (10): 1141-1148
-
2020,
Mukherjee N, Kundu A, Gupta B, Mitra M
2020 IEEE Calcutta Conference (CALCON), Kolkata, India. IEEE: pp. 240-243; ISBN 978-1-7281-5362-9
