2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Reno, NV, USA. IEEE: pp. 266-269; ISBN 978-1-7281-7431-0
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Reno, NV, USA. IEEE: pp. 659-662; ISBN 978-1-7281-7431-0
2020,
Muri L, Oberhänsli S, Buri M, Le ND, Grandgirard D, Bruggmann R, Müri RM, Leib SL