Literature search results

7000 articles were found.

The following terms were included: ウェル, Wells

• 2000, Stuchly MA, Gandhi OP
  Inter-laboratory comparison of numerical dosimetry for human exposure to 60 Hz electric and magnetic fields [tech./dosim.]
  Bioelectromagnetics 21 (3): 167-174
• 2000, Schönborn F, Pokovic K, Wobus AM, Kuster N
  Design, optimization, realization, and analysis of an in vitro system for the exposure of embryonic stem cells at 1.71 GHz [tech./dosim.]
  Bioelectromagnetics 21 (5): 372-384
• 2000, Schirmacher A, Winters S, Fischer S, Goeke J, Galla HJ, Kullnick U, Ringelstein EB, Stogbauer F
  [details] Electromagnetic fields (1.8 GHz) increase the permeability to sucrose of the blood-brain barrier in vitro [med./bio.]
  Bioelectromagnetics 21 (5): 338-345
• 2000, Sub-comrnittee on power frequency fields of COMAR
  [details] Possible health hazards from exposure to power-frequency electric and magnetic fields - a COMAR Technical Information Statement [guideline]
  IEEE Eng Med Biol Mag 19 (1): 131-137
• 2000, Freude G, Ullsperger P, Eggert S, Ruppe I
  [details] Microwaves emitted by cellular telephones affect human slow brain potentials [med./bio.]
  Eur J Appl Physiol 81 (1-2): 18-27
• 2000, Somosy Z
  Radiation response of cell organelles [review]
  Micron 31 (2): 165-181
• 2000, Ryan KL, D'Andrea JA, Jauchem JR, Mason PA
  Radio frequency radiation of millimeter wave length: potential occupational safety issues relating to surface heating [review]
  Health Phys 78 (2): 170-181
• 2000, Caplan LS, Schoenfeld ER, O'Leary ES, Leske MC
  [details] Breast cancer and electromagnetic fields - a review [review]
  Ann Epidemiol 10 (1): 31-44
• 2000, Fincham SM, Ugnat AM, Hill GB, Kreiger N, Mao Y
  Is occupation a risk factor for thyroid cancer? Canadian Cancer Registries Epidemiology Research Group [epidem.]
  J Occup Environ Med 42 (3): 318-322
• 1999, Galvan A, Cooray V
  Lightning Induced Voltages on Bare and Insulated Buried Cables [tech./dosim.]
  13th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 191-196; ISBN 978-3-9521199-3-8