The following terms were included:
"radio frequency", Hochfrequenz, HF, RF, 無線周波
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2022,
Huang Y, Li H, Hu T, Li J, Yiu CK, Zhou J, Li J, Huang X, Yao K, Qiu X, Zhou Y, Li D, Zhang B, Shi R, Liu Y, Wong TH, Wu M, Jia H, Gao Z, Zhang Z, He J, Zheng M, Song E, Wang L, Xu C, Yu X
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2022,
Fujita Y, Khoo HM, Hirayama M, Kawahara M, Koyama Y, Tarewaki H, Arisawa A, Yanagisawa T, Tani N, Oshino S, Lemieux L, Kishima H
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2022,
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2022,
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J Popul Ther Clin Pharmacol 29 (2): E79-E87
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2022,
Tang Z, Han K, Wang R, Zhang Y, Zhang H
Front Neurol 13: 918597
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Food Funct 13 (15): 7960-7983
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2022,
Herrero de la Parte B, Rodrigo I, Gutiérrez-Basoa J, Iturrizaga Correcher S, Mar Medina C, Echevarría-Uraga JJ, Garcia JA, Plazaola F, García-Alonso I
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2022,
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2022,
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2022,
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2022,
Ahlawat S, Kaim V, Kanaujia BK, Singh N, Rambabu K, Singh SP, Lay-Ekuakille A
IEEE Trans Instrum Meas 71: 1-10
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2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC), Gran Canaria, Spain. IEEE: pp. 1-4; ISBN 978-1-6654-9986-6
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2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC), Gran Canaria, Spain. IEEE: pp. 1-3; ISBN 978-1-6654-9986-6
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2022,
Mazloum T, Wang S, Wiart J
2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC), Gran Canaria, Spain. IEEE: pp. 1-2; ISBN 978-1-6654-9986-6
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2022,
Gökçen S, Kurt B, Küçükbağrıaçık Y, Ozgur-Buyukatalay E, Kismali G
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International Electrotechnical Commission (IEC), Institute of Electrical and Electronics Engineers (IEEE),
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2022,
El Abbasi M, Madi M, Jelinek HF, Kabalan KY
2022 International Workshop on Antenna Technology (iWAT), Dublin, Ireland. IEEE: pp. 1-4; ISBN 978-1-6654-9450-2
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2022,
Schiavoni A, Bastonero S, Lanzo R, Scotti R
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2022,
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2022,
Tharushi Perera PG, Linklater DP, Kosyer E, Croft R, Ivanova EP
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2022,
Lazhar B, Mohammed D, Redouane T
2022 6th International Conference on Advanced Technologies for Signal and Image Processing (ATSIP), Sfax, Tunisia. IEEE: pp. 1-6; ISBN 978-1-6654-5117-8
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2022,
Psenakova Z, Gombarska D, Bacova F, Čarnecká L
2022 ELEKTRO (ELEKTRO), Krakow, Poland. IEEE: pp. 1-4; ISBN 978-1-6654-6727-8
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2022,
Ates K, Carlak HF, Ozen S
Int J Occup Saf Ergon 28 (3): 1672-1682
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2022,
Lie G, Eleti S, Chan D, Roshen M, Cross S, Qureshi M
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