The following terms were included:
"exposure assessment", Expositionsabschätzung, ばく露評価
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2022,
Bonato M, Tognola G, Benini M, Gallucci S, Chiaramello E, Fiocchi S, Parazzini M
Sensors 22 (17): 6564
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2022,
Chiaraviglio L, Lodovisi C, Franci D, Pavoncello S, Merli E, Aureli T, Blefari-Melazzi N, Migliore MD, Alouini MS
IEEE Open J Commun Soc 3: 1445-1465
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2022,
Capstick M, Mischa Sabathy, Brönnimann M, Rivara B, Bruno Klopott, Kühn S, Xi J, Choi D, Kuster N
2022 Wireless Power Week (WPW), Bordeaux, France. IEEE: pp. 68-71; ISBN 978-1-6654-8446-6
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2022 Wireless Power Week (WPW), Bordeaux, France. IEEE: pp. 64-67; ISBN 978-1-6654-8446-6
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2022,
Li N, Wang Y, Zhang J, Gan Z
2022 IEEE 5th International Electrical and Energy Conference (CIEEC), Nangjing, China. IEEE: pp. 3944-3948; ISBN 978-1-6654-1105-9
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2022,
Fiocchi S, Chiaramello E, Bonato M, Gallucci S, Benini M, Tognola G, Dossi L, Parazzini M, Ravazzani P
2022 IEEE 21st Mediterranean Electrotechnical Conference (MELECON), Palermo, Italy. IEEE: pp. 1258-1263; ISBN 978-1-6654-4281-7
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2022,
Celaya-Echarri M, Azpilicueta L, Rodríguez-Corbo FA, Lopez-Iturri P, Shubair RM, Ramos V, Falcone F
IEEE Access 10: 78860-78874
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2022,
Ponti C, Schettini G
2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), Trento, Italy. IEEE: pp. 49-53; ISBN 978-1-6654-1094-6
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2022,
Gallucci S, Bonato M, Benini M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M
2022 Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy. IEEE: pp. 1-4; ISBN 978-1-6654-7111-4
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2022,
Adda S, Aureli T, Coltellacci S, D’elia S, Franci D, Grillo E, Pasquino N, Pavoncello S, Suman R, Vaccarono M
2022 IEEE International Workshop on Metrology for Living Environment (MetroLivEn), Cosenza, Italy. IEEE: pp. 258-262; ISBN 978-1-6654-0894-3
