The following terms were included:
"electromagnetic field", "Elektromagnetisches Feld", EMF, 電磁界
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2014,
Nowell M, Miserocchi A, McEvoy AW, Duncan JS
J Neurol Neurosurg Psychiatry 85 (11): 1273-1279
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Br J Cancer 111 (11): 2199-2200
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2014,
Freudenstein F, Wiedemann PM, Varsier N
Front Public Health 2: 289
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IEEE Antennas Propag Mag 56 (1): 219
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2014,
Lucia U, Ponzetto A, Deisboeck TS
Sci Rep 4: 6763
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 745-748; ISBN 978-4-88552-287-1
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2014,
Diao YL, Sun WN, Chan KH, Leung SW, Siu YM
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 226-229; ISBN 978-4-88552-287-1
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ScientificWorldJournal: 890518
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J Electromagn Anal 6 (14): 413-424
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2014,
Gao YH, Cheng K, Ge BF, Zhen P, Zhou J, Ma XN, Li SF, Chen KM
Zhongguo Gu Shang 27 (11): 933-937
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2014,
Lucke L, Bluvshtein V
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: pp. 286-289; ISBN 978-1-4244-7929-0
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2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: pp. 6549-6552; ISBN 978-1-4244-7929-0
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2014,
Lv B, Su C, Yang L, Xie Y, Wu T
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: pp. 986-989; ISBN 978-1-4244-7929-0
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2014,
Laakso I, Hirata A, Fujiwara O
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 202-205; ISBN 978-4-88552-287-1
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2014,
Kim M, Kim S, Ahn S, Chun Y, Park S
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 426-429; ISBN 978-4-88552-287-1
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2014,
Wiart J, Conil E, Varsier N, Sarrebourse T, Hadjem A, Martens L, Wermeeren G, Corre Y
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 635-637; ISBN 978-4-88552-287-1
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2014,
Shiina T, Suzuki Y, Kasai Y, Inami Y, Taki M, Wake K
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 166-169; ISBN 978-4-88552-287-1
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2014,
Choi DG, Kim KH, Jang JD, Chung SY, Gimm YM
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 638-641; ISBN 978-4-88552-287-1
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2014,
Kim HS, Lee YH, Choi HD, Lee AK, Lee YS, Pack JK, Kim N, Ahn YH
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 170-173; ISBN 978-4-88552-287-1
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2014,
Suzuki Y, Koike A, Takamura M, Taki M, Kojima M, Sasaki K, Chakarothai J, Wake K, Watanabe S
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 832-835; ISBN 978-4-88552-287-1
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2014,
Neufeld E, Kuster N
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 230-233; ISBN 978-4-88552-287-1
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2014,
Iwamoto T, Arima T, Uno T, Iwamoto T, Wake K, Fujii K, Watanabe S
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 529-532; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 625-628; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 206-209; ISBN 978-4-88552-287-1
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2014,
Gao YH, Zhen P, Zhou J, Ma XN, Yan JL, Li SF, Zhou YF, Chen KM
Zhongguo Yi Xue Ke Xue Yuan Xue Bao 36 (6): 660-667