The following terms were included:
"direct current", Gleichstrom, DC, 直流
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2016,
Miranda PC, Salvador R, Wenger C, Fernandes SR
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 6457-6460; ISBN 978-1-4577-0220-4
-
2016,
Powell ES, Carrico C, Westgate PM, Chelette KC, Nichols L, Reddy L, Salyers E, Ward A, Sawaki L
NeuroRehabilitation 39 (3): 439-449
-
2016,
Bastos R, Fernandes SR, Salvador R, Wenger C, de Carvalho MA, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 1754-1757; ISBN 978-1-4577-0220-4
-
2016,
Datta A, Krause MR, Pilly PK, Choe J, Zanos TP, Thomas C, Pack CC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 1774-1777; ISBN 978-1-4577-0220-4
-
2016,
Santos L, Martinho M, Salvador R, Wenger C, Fernandes SR, Ripolles O, Ruffini G, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 1778-1781; ISBN 978-1-4577-0220-4
-
2016,
Fernandes SR, Salvador R, Wenger C, de Carvalho MA, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 3121-3124; ISBN 978-1-4577-0220-4
-
2016,
Kozlov M, Lucano E, Angelone LM
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 6242-6245; ISBN 978-1-4577-0220-4
-
2016,
Xu CD, Cheng KWE, Zou Y, Ho HF, Wang XL
2016 International Symposium on Electrical Engineering (ISEE), Hong Kong, China. IEEE; ISBN 978-1-5090-5885-3
-
2016,
Datta S, Jose A, Vinoy KJ
2016 IEEE Annual India Conference (INDICON), Bangalore, India. IEEE; ISBN 978-1-5090-3647-9
-
2016,
Ladan S, Aghabarati A, Moini R, Fortin S, Li Y, Dawalibi FP
2016 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC), Xi'an, China. IEEE; ISBN 978-1-5090-5419-0