The following terms were included:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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1974,
Michaelson SM, Suess MJ
IEEE Trans Microw Theory Tech 22 (12): 1301-1302
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1974,
Lindauer GA, Liu LM, Skewes GW, Rosenbaum FJ
IEEE Trans Microw Theory Tech 22 (8): 790-793
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1974,
Giarola AJ, Krueger WF
IEEE Trans Microw Theory Tech 22 (4): 432-437
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IEEE Trans Biomed Eng 21 (2): 165-168
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1973,
Lords JL, Durney CH, Borg AM, Tinney CE
IEEE Trans Microw Theory Tech 21 (12): 834-836
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IEEE Trans Aerosp Electron Syst AES-9 (2): 225-228
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1973,
Kramar P, Emery AF, Lin JC, Guy AW
1973 IEEE G-MTT International Microwave Symposium, Boulder, CO, USA. IEEE: 265-267
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1973,
del Blanco JB, Romero-Sierra C, Tanner JA
1973 IEEE International Electromagnetic Compatibility Symposium Record, New York, NY, USA. IEEE: 1-6; ISBN 978-1-5090-3159-7
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1973,
Ho HS, Ginns EI, Christman CL
1973 IEEE G-MTT International Microwave Symposium, Boulder, CO, USA. IEEE: 255-256
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1973,
Haidt SJ, McTighe AH
1973 IEEE G-MTT International Microwave Symposium, Boulder, CO, USA. IEEE: 324-325
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1973,
Singewald ML, Langworthy OR, Kouwenhoven WB
IEEE Transactions on Power Apparatus and Systems PAS-92 (4): 1307-1309
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1973,
Geddes LA, Moore AG, Rosborough J, Tacker WA
IEEE Trans Biomed Eng 20 (6): 465-468
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IEEE Trans Communications 21 (9): 1015-1027
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1973,
Lin JC, Guy AW, Johnson CC
IEEE Trans Microw Theory Tech 21 (12): 791-797
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1973,
Ho HS, Ginns EI, Christman CL
IEEE Trans Microw Theory Tech 21 (12): 837-840
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1973,
Bonney CH, Rustan Jr PL, Ford GE
IEEE Trans Biomed Eng 20 (5): 357-364
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1973,
Huhta JC, Webster JG
IEEE Trans Biomed Eng 20 (2): 91-101
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IEEE Spectr 9 (2): 41-50
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Proc IEEE 60 (6): 692-718
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1972,
Kritikos HN, Schwan HP
IEEE Trans Biomed Eng 19 (1): 53-58
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IEEE Trans Biomed Eng 19 (4): 304-312
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IEEE Trans Microw Theory Tech 19 (2): 251-253
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1971,
Kaplan IT, Metlay W, Zaret MM, Birenbaum L, Rosenthal SW
IEEE Trans Microw Theory Tech 19 (2): 168-173
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1971,
Schuder JC, Gold JH, Stephenson Jr HE
IEEE Trans Biomed Eng BME-18 (4): 265 - 273
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1971 IEEE International Electromagnetic Compatibility Symposium Record, Philadelphia, PA, USA. IEEE: 155-161; ISBN 978-1-5090-3157-3