[Fundamental Study on Artifacts and Displacement Force of Cosmetics Such as Eye Makeup in MRI Examinations] foreign-language

MRI検査におけるアイメイクなどの化粧品のアーチファクトと変位力に関する基礎的研究

By: Hoshi Y, Tateishi T, Yabe K, Kimura T, Sone O, Nakanishi S, Saotome K
Published in: Nihon Hoshasen Gijutsu Gakkai Zasshi 2024; 81 (2)
Download citation in RIS format

Exposure