[Fundamental Study on Artifacts and Displacement Force of Cosmetics Such as Eye Makeup in MRI Examinations] foreign-language

By: Hoshi Y, Tateishi T, Yabe K, Kimura T, Sone O, Nakanishi S, Saotome K
Published in: Nihon Hoshasen Gijutsu Gakkai Zasshi 2024; 81 (2)
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Exposure