Verification Measurements of EMF Near Kindergarten as an Increased Sensitivity Area tech./dosim.

By: Milutinov M, Bjelica J, Kljajic D, Djuric N, Djuric S, Pasquino N
Published in: 2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE, 2024: 1-6; ISBN 9798350370546
Download citation in RIS format

Exposure