By:
Wane S, Dinh TV, Tran QH, Bajon D, Ferrero F, Duvillaret L, Gaborit G, Sombrin J, de Lédinghen E, Laban P, Huard V, Mhira S, Tombakdjian L, Ratajczak P, Bousseksou A
Published in: 2022 IEEE Radio and Wireless Symposium (RWS), Las Vegas, NV, USA. IEEE, 2022: pp. 68-71; ISBN 978-1-6654-3463-8
