By:
Orel VE, Rykhalskyi O, Syvak L, Smolanka I, Smolanka Jr I, Loboda A, Lyashenko A, Dosenko I, Mokhonko A, Golovko T, Ganich A, Orel VB
Published in: 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE, 2020: pp. 474-477; ISBN 978-1-7281-9714-2
