By:
Quirin T, Vergne C, Féry C, Badertscher P, Nicolas H, Mannhart D, Osswald S, Kuhne M, Sticherling C, Madec M, Hébrard L, Knecht S, Pascal J
Published in: 2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Messina, Italy. IEEE, 2022: pp. 1-6; ISBN 978-1-6654-8300-1