Stochastic Dosimetry applied on a low frequency Near-Field Source Scenario tech./dosim.

By: Bonato M, Chiaramello E, Fiocchi S, Gallucci S, Dossi L, Tognola G, Ravazzani P, Parazzini M
Published in: 2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE, 2020: pp. 429-433; ISBN 978-1-7281-5201-1
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Exposure