An ESD demonstrator system for evaluating the ESD risks of wearable devices
tech./dosim.
By:
Zhou J, Legenzoff Z, Yan X, Yang S, Xiang S, Shinde S, Lee J, Pommerenke D
Published in: 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Tucson, AZ, USA. IEEE, 2017: pp. 1-7; ISBN 978-1-5090-6499-1
