Effects of Selecting the Fitting Range for SAR Probe Calibration in Waveguide System
tech./dosim.
By:
Ishii N, Shimizu Y, Nagaoka T, Watanabe S
Published in: 2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM), Nagoya, Japan. IEEE, 2018: pp. 1-2; ISBN 978-1-5386-4835-3
